{"title":"Sinusoidal signal generation for mixed-signal BIST using a harmonic-cancellation technique","authors":"M. Barragán, G. Léger, D. Vázquez, A. Rueda","doi":"10.1109/LASCAS.2013.6519084","DOIUrl":null,"url":null,"abstract":"This work presents a technique for the generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. The proposed generation technique is based on a modified analog filter, that provides a sinusoidal output as the response to a DC input, combined with a harmonic cancellation technique. It has the attributes of digital programming and control, low area overhead, and low design effort, which make this approach very suitable as test stimulus generator for built-in test applications. Simulation results are provided in order to validate the proposed generation technique.","PeriodicalId":190693,"journal":{"name":"2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS)","volume":"154 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LASCAS.2013.6519084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
This work presents a technique for the generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. The proposed generation technique is based on a modified analog filter, that provides a sinusoidal output as the response to a DC input, combined with a harmonic cancellation technique. It has the attributes of digital programming and control, low area overhead, and low design effort, which make this approach very suitable as test stimulus generator for built-in test applications. Simulation results are provided in order to validate the proposed generation technique.