{"title":"Efficient automatic diagnosis of digital circuits","authors":"Liaw Heh-Tyan, Tsaih Jia-Horng, Lin Chen-Shang","doi":"10.1109/ICCAD.1990.129954","DOIUrl":null,"url":null,"abstract":"The problem of automatic diagnosis of digital circuits with efficiency is studied. Two improvements over the method of J.C. Madre et al. (1989) are developed to enhance the efficiency of diagnosis. Specifically, the dominance relation in circuit topology is utilized to reduce the search space of possibly correctable gates. In the authors' experiment, the search space is reduced to about one-half. A novel divide-and-conquer technique to determine the correct gate function is proposed.<<ETX>>","PeriodicalId":242666,"journal":{"name":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1990.129954","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 42
Abstract
The problem of automatic diagnosis of digital circuits with efficiency is studied. Two improvements over the method of J.C. Madre et al. (1989) are developed to enhance the efficiency of diagnosis. Specifically, the dominance relation in circuit topology is utilized to reduce the search space of possibly correctable gates. In the authors' experiment, the search space is reduced to about one-half. A novel divide-and-conquer technique to determine the correct gate function is proposed.<>