Efficient automatic diagnosis of digital circuits

Liaw Heh-Tyan, Tsaih Jia-Horng, Lin Chen-Shang
{"title":"Efficient automatic diagnosis of digital circuits","authors":"Liaw Heh-Tyan, Tsaih Jia-Horng, Lin Chen-Shang","doi":"10.1109/ICCAD.1990.129954","DOIUrl":null,"url":null,"abstract":"The problem of automatic diagnosis of digital circuits with efficiency is studied. Two improvements over the method of J.C. Madre et al. (1989) are developed to enhance the efficiency of diagnosis. Specifically, the dominance relation in circuit topology is utilized to reduce the search space of possibly correctable gates. In the authors' experiment, the search space is reduced to about one-half. A novel divide-and-conquer technique to determine the correct gate function is proposed.<<ETX>>","PeriodicalId":242666,"journal":{"name":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1990.129954","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 42

Abstract

The problem of automatic diagnosis of digital circuits with efficiency is studied. Two improvements over the method of J.C. Madre et al. (1989) are developed to enhance the efficiency of diagnosis. Specifically, the dominance relation in circuit topology is utilized to reduce the search space of possibly correctable gates. In the authors' experiment, the search space is reduced to about one-half. A novel divide-and-conquer technique to determine the correct gate function is proposed.<>
高效的数字电路自动诊断
研究了高效数字电路的自动诊断问题。在J.C. Madre et al.(1989)方法的基础上进行了两项改进,以提高诊断效率。具体来说,利用电路拓扑中的优势关系来减小可能可校正门的搜索空间。在作者的实验中,搜索空间减少到大约一半。提出了一种新的分治法来确定正确的门函数。
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