H. Kimura, T. Hanyu, M. Kameyama, Y. Fujimori, T. Nakamura, H. Takasu
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引用次数: 2
Abstract
A ferroelectric-based functional pass-gate is proposed for low-power logic-in-memory VLSI which makes communication bottlenecks free. Since non-destructive storage and switching functions are merged into a ferroelectric capacitor, active-device counts become small, which reduces the dynamic power dissipation. The use of ferroelectric-based non-volatile storage makes leakage currents cut off. Applying the ferroelectric-based circuitry to binary CAM implementation results in about half dynamic power reduction and 1/22000 static power reduction, compared to a. CMOS implementation under 0.6 /spl mu/m ferroelectric/CMOS.