Optimal number and placement of Through Silicon Vias in 3D Network-on-Chip

T. Xu, P. Liljeberg, H. Tenhunen
{"title":"Optimal number and placement of Through Silicon Vias in 3D Network-on-Chip","authors":"T. Xu, P. Liljeberg, H. Tenhunen","doi":"10.1109/DDECS.2011.5783057","DOIUrl":null,"url":null,"abstract":"In this paper, we analyze the performance impact of different number of Through Silicon Vias (TSVs) in 3D Network-on-Chip (NoC). The adoption of a 3D NoC design depends on the performance and manufacturing cost of the chip. Therefore, a study of the placement of the TSV, that connects different layers of a 3D chip, is crucial. A 64-core 3D NoC is modeled based on state-of-the-art 2D chips. We discuss the number of TSVs required for a 3D NoC. Different placements of layer-layer connections are explored. We present benchmark results using a cycle accurate full system simulator based on realistic workloads. Experiments show that under different workloads, the average network latencies in two configurations (full and quarter connection) are reduced by 14.78% and 7.38% respectively, compared with the one-eighth connection design. The improvement of performance is a trade-off of manufacturing cost. Our analysis and experiment results provide a guideline for selecting optimal number of TSVs in 3D NoCs.","PeriodicalId":231389,"journal":{"name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2011.5783057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 36

Abstract

In this paper, we analyze the performance impact of different number of Through Silicon Vias (TSVs) in 3D Network-on-Chip (NoC). The adoption of a 3D NoC design depends on the performance and manufacturing cost of the chip. Therefore, a study of the placement of the TSV, that connects different layers of a 3D chip, is crucial. A 64-core 3D NoC is modeled based on state-of-the-art 2D chips. We discuss the number of TSVs required for a 3D NoC. Different placements of layer-layer connections are explored. We present benchmark results using a cycle accurate full system simulator based on realistic workloads. Experiments show that under different workloads, the average network latencies in two configurations (full and quarter connection) are reduced by 14.78% and 7.38% respectively, compared with the one-eighth connection design. The improvement of performance is a trade-off of manufacturing cost. Our analysis and experiment results provide a guideline for selecting optimal number of TSVs in 3D NoCs.
三维片上网络中硅通孔的最佳数量和位置
本文分析了三维片上网络(NoC)中不同数量的硅通孔(tsv)对性能的影响。采用3D NoC设计取决于芯片的性能和制造成本。因此,研究连接3D芯片不同层的TSV的位置是至关重要的。64核3D NoC是基于最先进的2D芯片建模的。我们讨论了3D NoC所需的tsv数量。探索了层与层之间连接的不同位置。我们使用基于实际工作负载的周期精确的全系统模拟器提供基准测试结果。实验表明,在不同的工作负载下,与八分之一连接设计相比,两种配置(全连接和四分之一连接)的平均网络延迟分别降低了14.78%和7.38%。性能的提高是以制造成本为代价的。我们的分析和实验结果为三维NoCs中tsv的最佳数量选择提供了指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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