Analog signal metrology for mixed signal ICs

Abstract

Signal reconstruction reconstructs a multiple period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20 MHz 8-bit ADC.