Phase change router for nonvolatile logic

Nadim H. Kan'an, H. Silva, A. Gokirmak
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引用次数: 4

Abstract

Phase change memory is moving into the main stream and this technology offers the possibility of integration of high-density high-speed non-volatile memory banks atop CMOS in the same package (Figure 1). Elimination of the memory access latencies associated with the I/O bottleneck will allow CPUs to operate more than 1000x faster and at a fraction of the energy. The two main challenges facing this major breakthrough at the present day are (1) the phase-change memory reliability, and (2) the CMOS foot-print associated with the memory cells and the access circuitry. Recent advances in phase-change materials and device research is expected to yield the desired device reliability and cross-bar arrays are expected to reduce the CMOS access circuitry (foot-print on the CMOS layer) sufficiently to integrate 100s of GB memory onto the CPU. Moving some of the logic and the memory controls to the PCM level will significantly relieve the area concerns in the underlying CMOS layer.
用于非易失性逻辑的相变路由器
相变存储器正在成为主流,该技术提供了在相同封装的CMOS上集成高密度高速非易失性存储器组的可能性(图1)。消除与I/O瓶颈相关的存储器访问延迟将使cpu的运行速度提高1000倍以上,并且能耗更低。目前这一重大突破面临的两个主要挑战是:(1)相变存储器的可靠性,(2)与存储器单元和访问电路相关的CMOS足迹。相变材料和器件研究的最新进展有望产生期望的器件可靠性,交叉条阵列有望减少CMOS访问电路(CMOS层上的占地面积),足以将100 GB的内存集成到CPU上。将一些逻辑和存储器控制移到PCM级将显著缓解底层CMOS层的面积问题。
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