Jiang Yanfeng, L. Siyuan, Li Hairong, Meng Xionghui
{"title":"Influence of \"gate-biasing effect\" on BSIT's saturated property","authors":"Jiang Yanfeng, L. Siyuan, Li Hairong, Meng Xionghui","doi":"10.1109/ICSICT.1998.785837","DOIUrl":null,"url":null,"abstract":"For BSIT, it is well-known that the ideal relation between the drain current and the drain voltage with respect to the source is pentode-like, the saturated property. But the result from practical measurements shows I/sub D/ increases slightly with rising V/sub D/, just like the phenomenon observed in a BJT, which is affected by \"base width modulation\". The authors deduce that the main cause is \"gate-biasing effect\". In this article, the effect is discussed in detail.","PeriodicalId":286980,"journal":{"name":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT.1998.785837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For BSIT, it is well-known that the ideal relation between the drain current and the drain voltage with respect to the source is pentode-like, the saturated property. But the result from practical measurements shows I/sub D/ increases slightly with rising V/sub D/, just like the phenomenon observed in a BJT, which is affected by "base width modulation". The authors deduce that the main cause is "gate-biasing effect". In this article, the effect is discussed in detail.