Simulated Annealing Applied to LUT-Based FPGA Technology Mapping

Matheus Nachtigall, Paulo Ferreira, F. Marques
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引用次数: 1

Abstract

Technology Mapping is one of the most important steps in the logic synthesis process, since it defines which set of logic elements will be used to implement the circuit in the target technology. This work proposes a mapping approach for Field Programmable Gate Arrays (FPGAs) based on the Simulated Annealing optimization technique to find an alternative solution to the problem. The utilization of Artificial Intelligence in Technology Mapping is promising because it strongly differs from existing algorithms due to the randomness factors in AI-based techniques. The developed approach acts on the mapping stage called coverage, aiming to minimize the number of K-cuts needed to map the complete logic of the circuit from the inputs to the outputs. Tests were performed in 85 benchmarks of the ISCAS85 and MCNC91 packages, widely known in the area and commonly used for performance testing of new approaches. The tests conducted found solutions comparable in several cases to the ABC tool, considered state-of-the-art in the Technology Mapping process, and even superior in some benchmarks, achieving improvements over ABC's results in approximately 19% of the evaluated benchmarks with K = 4 and 26% with K = 5.
模拟退火在基于lut的FPGA技术映射中的应用
技术映射是逻辑综合过程中最重要的步骤之一,因为它定义了哪一组逻辑元件将用于实现目标技术中的电路。本文提出了一种基于模拟退火优化技术的现场可编程门阵列(fpga)的映射方法,以寻找问题的替代解决方案。人工智能在技术映射中的应用是有前途的,因为它与现有的基于人工智能技术的随机性因素的算法有很大的不同。开发的方法作用于称为覆盖的映射阶段,旨在最大限度地减少从输入到输出映射电路的完整逻辑所需的k -cut数量。在ISCAS85和MCNC91包的85个基准测试中进行了测试,这些包在该领域广为人知,通常用于新方法的性能测试。所进行的测试发现,在一些情况下,解决方案可与ABC工具相媲美,在技术映射过程中被认为是最先进的,甚至在一些基准测试中更胜一筹,在K = 4和K = 5的评估基准测试中,分别有19%和26%的基准测试比ABC的结果有所改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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