Shuo-Han Chen, Yu-Pei Liang, Yuan-Hao Chang, H. Wei, W. Shih
{"title":"Boosting the Profitability of NVRAM-based Storage Devices via the Concept of Dual-Chunking Data Deduplication","authors":"Shuo-Han Chen, Yu-Pei Liang, Yuan-Hao Chang, H. Wei, W. Shih","doi":"10.1109/ASP-DAC47756.2020.9045622","DOIUrl":null,"url":null,"abstract":"With the latest advance in the non-volatile random-access memory (NVRAM), NVRAM is widely considered as the mainstream for the next-generation storage mediums. NVRAM has numerous attractive features, which include byte addressability, limited idle energy consumption, and great read/write access speed. However, owing to the high manufacturing cost of NVRAM, the incentive of deploying NVRAM in consumer electronics is lowered due to the consideration of profitability. To resolve the profitability issue and bring the benefits of NVRAM into the design of consumer electronics, avoiding storing duplicate data on NVRAM becomes a crucial task for lowering the demand and deployment cost of NVRAM. Such observation motivates us to propose a data deduplication extended file system design (DeEXT) to boost the profitability of NVRAM via the concept of dual-chunking data deduplication while considering the characteristics of NVRAM and duplicate data content. The proposed DeEXT was then evaluated by real-world data deduplication traces with encouraging results.","PeriodicalId":125112,"journal":{"name":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASP-DAC47756.2020.9045622","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
With the latest advance in the non-volatile random-access memory (NVRAM), NVRAM is widely considered as the mainstream for the next-generation storage mediums. NVRAM has numerous attractive features, which include byte addressability, limited idle energy consumption, and great read/write access speed. However, owing to the high manufacturing cost of NVRAM, the incentive of deploying NVRAM in consumer electronics is lowered due to the consideration of profitability. To resolve the profitability issue and bring the benefits of NVRAM into the design of consumer electronics, avoiding storing duplicate data on NVRAM becomes a crucial task for lowering the demand and deployment cost of NVRAM. Such observation motivates us to propose a data deduplication extended file system design (DeEXT) to boost the profitability of NVRAM via the concept of dual-chunking data deduplication while considering the characteristics of NVRAM and duplicate data content. The proposed DeEXT was then evaluated by real-world data deduplication traces with encouraging results.