A test generation method for sequential circuits based on maximum utilization of internal states

Toshinobu Ono, Masaaki Yoshida
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引用次数: 7

Abstract

This paper presents a novel deterministic test pattern generation method for sequential circuits. The proposed method has several advantages over conventional methods, particularly in its maximum utilization of internal states. Such utilization permits shorter computational time, reduced test pattern length and fewer timing problems. In this method, the type of fault targeted for the next pattern generation is that which, on the basis of the current internal state of the circuit, is determined to be the easiest type to detect, and during pattern generation, the only value transitions traced are those which are necessary for a particular fault's detection. Experimental results show the proposed method to be efficient.
基于内部状态最大利用率的顺序电路测试生成方法
提出了一种新的顺序电路确定性测试图生成方法。与传统方法相比,该方法具有许多优点,特别是在最大限度地利用内部状态方面。这样的利用允许更短的计算时间,减少测试模式长度和更少的时间问题。在该方法中,下一个模式生成的目标故障类型是根据电路当前的内部状态确定为最容易检测的类型,并且在模式生成过程中,跟踪的唯一值转换是检测特定故障所必需的。实验结果表明,该方法是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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