Fundamental Study on Influence of Intentional Electromagnetic Interference on IC Communication

Hikaru Nishiyama, Takumi Okamoto, Youngwoo Kim, Daisuke Fujimoto, Y. Hayashi
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Abstract

Low-Power intentional electromagnetic interference (IEMI) has been reported to cause device malfunction without disrupting the device itself via an IEMI of several volts. In this paper, we intentionally generated errors on transmitted data between ICs using Low-Power IEMI to investigate possibilities of changes in the commands executed based on transmitted data. To evaluate impacts of the Low-Power IEMI threat on transmitted data between ICs, we applied Low-Power IEMI threat to the device via power distribution network with frequency and amplitude variation. The experiment results indicated that error occurrence probability of data errors in transmitted data changes in accordance with the number of Hamming Weights of data, frequency, and amplitude of the applied interference wave. Based on these results, we speculate the influence of voltage drop caused by applying Low-Power IEMI and output status in I/O circuits.
有意电磁干扰对集成电路通信影响的基础研究
据报道,低功率故意电磁干扰(IEMI)会导致设备故障,而不会通过几伏特的IEMI破坏设备本身。在本文中,我们使用低功耗IEMI故意在ic之间传输的数据上产生错误,以调查基于传输数据执行的命令变化的可能性。为了评估低功率IEMI威胁对ic之间传输数据的影响,我们通过频率和幅度变化的配电网络对设备施加了低功率IEMI威胁。实验结果表明,传输数据中数据误差的发生概率随数据的汉明权数、施加的干扰波的频率和幅值而变化。基于这些结果,我们推测了在I/O电路中应用低功率IEMI和输出状态所引起的电压降的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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