Electromagnetic modeling and transient simulation of interconnects in high speed VLSI

Abstract

A new technique is implemented in the method of lines to calculate the static parameters of a multilayered multiconductor system. Every dielectric layer is equivalent to a transmission line and every interface with conductors is equivalent to a current source, thus the whole structure is equivalent to a series of cascading two port networks. A bilevel waveform relaxation method is then used to compute the transient response of such a system terminated in arbitrary loads. All these are integrated into a software specially for the interconnect problems and one of its typical applications is presented.