{"title":"Remote online testing of embedded systems using Optical BILBO","authors":"Abdelhakim Latoui, R. Canals","doi":"10.1109/BEC.2014.7320566","DOIUrl":null,"url":null,"abstract":"In this paper, an online testing approach that checks continuously at remote system the correctness of embedded systems in full operation is proposed. Our new method exploits optical beams produced by an Optical Built-In Logic-Block Observation (OBILBO) register based on the captured data presented on the outputs of all stages of the registers in the BILBO. Then it is possible to send the captured data to remote system equipped with optical sensors in real time way. The final captured response data can also be used for final comparison with stored data of a golden circuit. Preliminary simulation results showed that faults are concurrently detected without affecting normal system operation and without having recourse to any external or internal Automatic Test Pattern Generation (ATPG).","PeriodicalId":348260,"journal":{"name":"2014 14th Biennial Baltic Electronic Conference (BEC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 14th Biennial Baltic Electronic Conference (BEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2014.7320566","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, an online testing approach that checks continuously at remote system the correctness of embedded systems in full operation is proposed. Our new method exploits optical beams produced by an Optical Built-In Logic-Block Observation (OBILBO) register based on the captured data presented on the outputs of all stages of the registers in the BILBO. Then it is possible to send the captured data to remote system equipped with optical sensors in real time way. The final captured response data can also be used for final comparison with stored data of a golden circuit. Preliminary simulation results showed that faults are concurrently detected without affecting normal system operation and without having recourse to any external or internal Automatic Test Pattern Generation (ATPG).