Advanced Package FAB Solutions(APFS) for Chiplet Integration

S. Yoon
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Abstract

For HPC applications, 2.5D and 3D technologies are employed for cloud, AI and ML. High-performance chip size continues to increase up to one reticle size and the cost of the leading-edge silicon node is recently soaring. This makes various solutions, such as MCM, 2.5D and 3D, necessary to develop fine pitch interconnection evolutions with hybrid Cu bonding or fine pitch microbump bonding processes. In this paper, the above mentioned Advanced Package FAB Solutions (APFS) will be introduced and discussed in terms of challenges and opportunities for emerging high-end computing and mobile processor platforms. Additionally, Fanout PKG, RDL interposer, high-performance 3D SIP and Integrated Stacked Capacitor (ISC) will also be introduced.
芯片集成的先进封装FAB解决方案(APFS)
对于高性能计算应用,云计算、人工智能和机器学习采用了2.5D和3D技术。高性能芯片尺寸继续增加到一个网线尺寸,尖端硅节点的成本最近也在飙升。这使得各种解决方案,如MCM, 2.5D和3D,必须通过混合Cu键合或细间距微凸键合工艺来发展细间距互连演变。本文将从新兴高端计算和移动处理器平台的挑战和机遇两方面,对上述先进封装FAB解决方案(APFS)进行介绍和讨论。此外,Fanout PKG, RDL中间层,高性能3D SIP和集成堆叠电容器(ISC)也将推出。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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