T. Palacios, S. Rajan, L. Shen, A. Chakraborty, S. Heikman, S. Keller, S. Denbaars, U. Mishra
{"title":"Influence of the access resistance in the rf performance of mm-wave AlGaN/GaN HEMTs","authors":"T. Palacios, S. Rajan, L. Shen, A. Chakraborty, S. Heikman, S. Keller, S. Denbaars, U. Mishra","doi":"10.1109/DRC.2004.1367790","DOIUrl":null,"url":null,"abstract":"After demonstrating impressive performance in the X-band frequencies, one of the next goals for GaN-based power transistors is to increase the frequency of operation to the mm-wave range. Monte Carlo simulations predict that the saturation electron velocity in AlGaN/GaN high electron mobility transistors (HEMTs) should be around 2.5/spl times/10/sup 7/ cm/s (M. Singh and J. Singh, J. Appl. Phys. vol. 94, p. 2498, 2003). The study of f/sub T/ vs I/sub DS/ from pinch-off to saturation is a very useful tool to understand the maximum frequency performance of mm-wave HEMTs. In this work, we have studied the effect of parasitic resistances in the shape of the f/sub T/ vs I/sub DS/ curve. R/sub s/ increases with the current density in the channel. The extraction of the effect of the differential access resistance out of f/sub T/ greatly changes the shape of the curve. The access resistances play an important role in the rf behavior of AlGaN/GaN transistors. Not only the absolute values, but also their increase with current must be controlled in order to get the maximum performance out of the GaN-based HEMTs.","PeriodicalId":385948,"journal":{"name":"Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC.","volume":"269 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2004.1367790","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
After demonstrating impressive performance in the X-band frequencies, one of the next goals for GaN-based power transistors is to increase the frequency of operation to the mm-wave range. Monte Carlo simulations predict that the saturation electron velocity in AlGaN/GaN high electron mobility transistors (HEMTs) should be around 2.5/spl times/10/sup 7/ cm/s (M. Singh and J. Singh, J. Appl. Phys. vol. 94, p. 2498, 2003). The study of f/sub T/ vs I/sub DS/ from pinch-off to saturation is a very useful tool to understand the maximum frequency performance of mm-wave HEMTs. In this work, we have studied the effect of parasitic resistances in the shape of the f/sub T/ vs I/sub DS/ curve. R/sub s/ increases with the current density in the channel. The extraction of the effect of the differential access resistance out of f/sub T/ greatly changes the shape of the curve. The access resistances play an important role in the rf behavior of AlGaN/GaN transistors. Not only the absolute values, but also their increase with current must be controlled in order to get the maximum performance out of the GaN-based HEMTs.