Approach to Estimation of Modern IC’s Sustainability After Series of Single Events

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696099

G. Davydov, P. Skorobogatov, D. Boychenko, N. S. Dyatlov

引用次数: 1

Abstract

The approach developed in this work allows one to estimate limiting characteristics of single or series of impacts to provide guaranteed further functionality of modern ICs. It may be used also to estimate fault probability after one or series of impacts with known characteristics.

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一系列单一事件后现代集成电路可持续性评估方法

在这项工作中开发的方法允许人们估计单个或一系列影响的限制特性，以保证现代集成电路的进一步功能。它也可用来估计一次或一系列具有已知特征的冲击后的故障概率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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