Post-enabled precision flip-chip assembly for variable MEMS capacitor

F. Faheem, N. Hoivik, Y.C. Lee, K. Gupta
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引用次数: 11

Abstract

A variable capacitor array with a high Q-factor and a high tuning ratio is demonstrated. A novel "post-enabled" flip-chip assembly allows precise multiple digital capacitance levels within one device. This capacitor array is realized by a hybrid integration of a MEMS device with RF circuits on an alumina substrate. The MEMS is prefabricated using a commercially available foundry process and is initially suspended using mechanical tethers on a silicon substrate, which is removed during the flip-chip assembly. The precise gap between the MEMS and the RF circuit is controlled using posts. Each post is designed by a stack of structural layers available in the commercial foundry process. We measured a Q-factor above 200 at 1 GHz, a capacitance ratio of 4.7:1, and tuning range of 171 MHz in a resonator circuit. More importantly, we achieved a digital capacitance level and negligible warpage due to the excellent gap control following the flip-chip assembly.
可变MEMS电容器的后使能精密倒装芯片组装
提出了一种具有高q因子和高调谐比的可变电容阵列。一种新颖的“后启用”倒装芯片组件允许在一个器件内精确的多个数字电容电平。该电容器阵列是通过将MEMS器件与射频电路混合集成在氧化铝衬底上实现的。MEMS采用商用铸造工艺预制,最初在硅衬底上使用机械系绳悬浮,在倒装芯片组装过程中移除。MEMS和RF电路之间的精确间隙是用柱控制的。每个柱子都是由商业铸造工艺中可用的一堆结构层设计的。我们在1 GHz的谐振器电路中测量了超过200的q因子,电容比为4.7:1,调谐范围为171 MHz。更重要的是,我们实现了一个数字电容水平和可忽略的翘曲,由于良好的间隙控制后倒装芯片组装。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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