CA based implementation of March test for high speed memories

M. Saha, B. Sikdar
{"title":"CA based implementation of March test for high speed memories","authors":"M. Saha, B. Sikdar","doi":"10.1109/ICCIRCUITSANDSYSTEMS.2012.6408319","DOIUrl":null,"url":null,"abstract":"This work proposes an efficient realization of March test for fault detection in high speed memories. The realization is based on the theory of a modeling tool called cellular automata (CA). A special class of CA architecture referred to as the SACA is considered for the test logic design. The test logic/hardware thus developed operates on the data read from the memory during March. It outputs an one-bit signature to detect faults in the memory chip, effectively reducing the comparison time required in conventional realization. The regular structure of CA enables low cost implementation of the test hardware for a memory chip, that is inherently regular in structure. The introduction of segmented CA structure further enables the drastic reduction in testing time.","PeriodicalId":325846,"journal":{"name":"2012 IEEE International Conference on Circuits and Systems (ICCAS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Conference on Circuits and Systems (ICCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCIRCUITSANDSYSTEMS.2012.6408319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This work proposes an efficient realization of March test for fault detection in high speed memories. The realization is based on the theory of a modeling tool called cellular automata (CA). A special class of CA architecture referred to as the SACA is considered for the test logic design. The test logic/hardware thus developed operates on the data read from the memory during March. It outputs an one-bit signature to detect faults in the memory chip, effectively reducing the comparison time required in conventional realization. The regular structure of CA enables low cost implementation of the test hardware for a memory chip, that is inherently regular in structure. The introduction of segmented CA structure further enables the drastic reduction in testing time.
基于CA的高速存储器三月测试实现
本文提出了一种高效实现高速存储器故障检测的三月测试方法。该实现是基于一种称为元胞自动机(CA)的建模工具的理论。在测试逻辑设计中考虑了一类特殊的CA体系结构(称为SACA)。因此开发的测试逻辑/硬件对三月期间从存储器中读取的数据进行操作。它输出一个1位签名来检测存储芯片中的故障,有效地减少了传统实现所需的比较时间。CA的规则结构使得存储器芯片的测试硬件的低成本实现成为可能。分段CA结构的引入进一步大大缩短了测试时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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