{"title":"Survey on Integrated High-Power Low-Emission Output Stages for Drivers of Low-Frequency Resonant Loads","authors":"H. Hackl, M. Auer, R. Erckert","doi":"10.1109/AUSTROCHIP.2017.20","DOIUrl":null,"url":null,"abstract":"To drive low-frequency resonant loads with high output power and low emission, Class-AB push-pull stages are state of the art. But their theoretically superior emission performance is often sacrificed for efficiency. A differential Class-D concept is a promising alternative, because it can combine both excellent power efficiency and low missions. This work is a survey on the main sources of distortions for both amplifier topologies with basic considerations to internal power losses and efficiency. The investigations are based on simple circuits and compared to measurement results of two integrated circuits.","PeriodicalId":415804,"journal":{"name":"2017 Austrochip Workshop on Microelectronics (Austrochip)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Austrochip Workshop on Microelectronics (Austrochip)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUSTROCHIP.2017.20","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
To drive low-frequency resonant loads with high output power and low emission, Class-AB push-pull stages are state of the art. But their theoretically superior emission performance is often sacrificed for efficiency. A differential Class-D concept is a promising alternative, because it can combine both excellent power efficiency and low missions. This work is a survey on the main sources of distortions for both amplifier topologies with basic considerations to internal power losses and efficiency. The investigations are based on simple circuits and compared to measurement results of two integrated circuits.