The fabrication of and performance of L.E.D.'s and detectors from the Ga/In/As alloy system

A. Mabbitt, K. Ahmad
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引用次数: 1

Abstract

The preparation and performance of GaAs and GaInAs 1.06µm LEDs and 1.15µm detectors is described. In each case the basic device material is prepared by a vapour phase hydride growth process and p-n junctions are grown-in during epitaxy by switching dopant sources during growth. LED 'p' type doping levels in the 8 × 1018- 4 × 1019holes/ cc range are used to assess the trade off of device speed and radiance with carrier density. These results are given and so demonstrate the possibility of fabricating LEDs with 3dB modulation bandwidths exceeding 500 MHz. Life test data on these LEDs is also reported. Detectors with quantum efficiency of 80% at 1.15 microns and RC limited rise times of 5 nsec are obtained and their I-V characteristics given.
led的制造与性能来自Ga/In/As合金系统的探测器
介绍了GaAs和GaInAs 1.06µm led和1.15µm探测器的制备和性能。在每种情况下,基本器件材料都是通过气相氢化物生长工艺制备的,并且在生长过程中通过切换掺杂源在外延过程中生长p-n结。在8 × 1018- 4 × 1019holes/ cc范围内的LED 'p'型掺杂水平用于评估器件速度和发光度与载流子密度之间的权衡。这些结果证明了制造3dB调制带宽超过500mhz的led的可能性。还报告了这些led的寿命测试数据。在1.15微米处获得了量子效率为80%,RC限制上升时间为5 nsec的探测器,并给出了它们的I-V特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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