Assessing the accuracy of imaging techniques for defect characterization on thin film solar cells

Abstract

Imaging methods are an essential tool for improving processing of solar cells. Unfortunately, it is difficult to validate the imaging methods in detail. One focus of our work was to establish an approach by which one can assess the accuracy of the determination of the influence of defects via imaging on CIGS solar cells. The method is, however, not restricted to CIGS and should be easily transferable to other solar cell types, in particular other thin film technologies. The benefit of such a method is the possibility to validate and optimize imaging techniques and, in turn, improving tools to optimize solar cell material and processing of solar cells.