3D system simulation study of power integrity using Si interposer with distribution TSV decoupling capacitors

K. Kohno, Y. Kitamura, T. Kamada, J. Ohara, Y. Akiyama, C. Ueda, K. Otsuka
{"title":"3D system simulation study of power integrity using Si interposer with distribution TSV decoupling capacitors","authors":"K. Kohno, Y. Kitamura, T. Kamada, J. Ohara, Y. Akiyama, C. Ueda, K. Otsuka","doi":"10.1109/ICSJ.2012.6523458","DOIUrl":null,"url":null,"abstract":"Improvements of power integrity (PI) on high-speed system have been studied from the point view of many structures in huge papers[1][2][3]. In this study, the PI simulation for the A-D mixed 3D stack chip system by TSV is done in many kinds of power sources. We already studied on the interposer with large area MIM capacitor was effective for the 3D system [4][5], that understood as an area structure made lower input impedance ever GHz region. As a result, we can find which the input impedance is related largely with the DeCap TSV distribution pitch. Consideration of approach wiring to distributed DeCap TSVs is the key issue for the better PI performance as the result.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 2nd IEEE CPMT Symposium Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSJ.2012.6523458","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Improvements of power integrity (PI) on high-speed system have been studied from the point view of many structures in huge papers[1][2][3]. In this study, the PI simulation for the A-D mixed 3D stack chip system by TSV is done in many kinds of power sources. We already studied on the interposer with large area MIM capacitor was effective for the 3D system [4][5], that understood as an area structure made lower input impedance ever GHz region. As a result, we can find which the input impedance is related largely with the DeCap TSV distribution pitch. Consideration of approach wiring to distributed DeCap TSVs is the key issue for the better PI performance as the result.
分布式TSV去耦电容硅介面电源完整性的三维系统仿真研究
大量论文从许多结构的角度研究了高速系统功率完整性(PI)的改进[1][2][3]。本文利用TSV软件对A-D混合三维堆叠芯片系统进行了多种电源下的PI仿真。我们已经研究了具有大面积MIM电容的中间体对3D系统的有效性[4][5],其理解为在GHz区域内具有较低输入阻抗的面积结构。因此,我们可以发现哪些输入阻抗与DeCap TSV分布间距有很大关系。考虑到分布式DeCap tsv的布线方法是提高PI性能的关键问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信