{"title":"The total CIM system for semiconductor plants","authors":"Y. Mizokami","doi":"10.1109/ISMSS.1990.66124","DOIUrl":null,"url":null,"abstract":"A CIM (computer-integrated manufacturing) system implemented in a plant for memory-device production is described. It is noted that application of this system is making it possible to prevent operational error, to reduce manpower, and to improve quality control. After the installation of an ultraclean process, a high-yield VLSI plant with fewer operators was realized.<<ETX>>","PeriodicalId":398535,"journal":{"name":"IEEE/SEMI International Symposium on Semiconductor Manufacturing Science","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI International Symposium on Semiconductor Manufacturing Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISMSS.1990.66124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A CIM (computer-integrated manufacturing) system implemented in a plant for memory-device production is described. It is noted that application of this system is making it possible to prevent operational error, to reduce manpower, and to improve quality control. After the installation of an ultraclean process, a high-yield VLSI plant with fewer operators was realized.<>