{"title":"A simple constitutive model for dielectric charging based on Frenkel-Poole mechanism","authors":"T. Rubin, G. Papaioannou, D. Elata","doi":"10.1109/EUROSIME.2015.7103090","DOIUrl":null,"url":null,"abstract":"We present a new simple constitutive model for dielectric charging. The model is motivated by the functional form of the Frenkel-Poole conduction, but it enables to track the time evolution of charge distribution within the dielectric. The prediction of charge distribution is used to deduce the voltage buildup in the dielectric. Based on this model, we present a prediction of the current through a Metal-Insulator-Metal (MIM) structure when it is subjected to voltage loading, and present a prediction of the discharge process and its limitations. We propose a voltage-control measurement protocol for the MIM structure, to calibrate the two material parameters of the model.","PeriodicalId":250897,"journal":{"name":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"156 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2015.7103090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We present a new simple constitutive model for dielectric charging. The model is motivated by the functional form of the Frenkel-Poole conduction, but it enables to track the time evolution of charge distribution within the dielectric. The prediction of charge distribution is used to deduce the voltage buildup in the dielectric. Based on this model, we present a prediction of the current through a Metal-Insulator-Metal (MIM) structure when it is subjected to voltage loading, and present a prediction of the discharge process and its limitations. We propose a voltage-control measurement protocol for the MIM structure, to calibrate the two material parameters of the model.