Study of Thermal Transport Anisotropy in Porous Silicon Systems by Raman Technique

Abstract

We have investigated the thermal transport in anisotropic nanostructured materials. Particularly, porous silicon and silicon nanowires arrays have been considered in this work. For thermal conductivity evaluation Raman technique has been applied. The thermal transport anisotropy is more pronounce in silicon nanowires array than in porous silicon. Yet, the in-plane and cross-plane thermal conductivities of porous silicon differ approximately in twice. Both values are in a good agreement with the literature.