C. Ziegler, S. Martius, B. Schmauss, L. Schmidt, R. Hocke, O. Wohlgemuth
{"title":"Multiport Network Analysis at High Frequencies","authors":"C. Ziegler, S. Martius, B. Schmauss, L. Schmidt, R. Hocke, O. Wohlgemuth","doi":"10.1109/SPI.2002.258289","DOIUrl":null,"url":null,"abstract":"This paper describes the problem of characterizing multiport networks at high frequencies, especially such devices which are stimulated by a common-mode or differential-mode source. An overview over the definition of mixed-mode S-parameters and their relation to nodal S-parameters is given. A measurement system is presented, which enables to measure all S-parameters of a 4-port with a 2-port network analyzer in an automated procedure. The functionality of this measurement system is described and possible ways for calibration are shown.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2002.258289","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper describes the problem of characterizing multiport networks at high frequencies, especially such devices which are stimulated by a common-mode or differential-mode source. An overview over the definition of mixed-mode S-parameters and their relation to nodal S-parameters is given. A measurement system is presented, which enables to measure all S-parameters of a 4-port with a 2-port network analyzer in an automated procedure. The functionality of this measurement system is described and possible ways for calibration are shown.