Dalin Yao, M. Gu, Xiaolin Liu, Shi-ming Huang, Bo Liu, Chen Ni
{"title":"Morphology and structure properties of columnar CsI films on optical fiber plate","authors":"Dalin Yao, M. Gu, Xiaolin Liu, Shi-ming Huang, Bo Liu, Chen Ni","doi":"10.1117/12.888348","DOIUrl":null,"url":null,"abstract":"Among scintillators, columnar CsI screens are used in applications detecting charged particles, UV light or X-ray for high energy physics and medical radiography. CsI scintillator can be grown in special microcolumnar form that preserves spatial resolution in thick coatings. We report on the columnar CsI films fabricated directly on optical-fiber plate by traditional vacuum deposition method. There morphology and structure were examined by scanning electron microscopy and X-ray diffraction. Properties of films depend on deposit condition are discussed.","PeriodicalId":316559,"journal":{"name":"International Conference on Thin Film Physics and Applications","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Thin Film Physics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.888348","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Among scintillators, columnar CsI screens are used in applications detecting charged particles, UV light or X-ray for high energy physics and medical radiography. CsI scintillator can be grown in special microcolumnar form that preserves spatial resolution in thick coatings. We report on the columnar CsI films fabricated directly on optical-fiber plate by traditional vacuum deposition method. There morphology and structure were examined by scanning electron microscopy and X-ray diffraction. Properties of films depend on deposit condition are discussed.