Accurate and global model of SOI H gate body-tied MOSFET for circuit simulator

M. Mochizuki, H. Hayashi, S. Ishii, S. Ohira, I. Kurachi, N. Miura
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引用次数: 3

Abstract

Drain current of SOI H-type body-tied MOSFET can be modulated in gate length or width because of its additional gate region. It causes a serious problem especially in analog circuit design. There is, however, no model including the gate shape effect even in the newest release BSIMSOI [1]. An accurate and global model of SOI H-type body-tied MOSFET in circuit simulation has been proposed for the first time. It is confirmed that the simulation accuracy of the proposed model has greatly improved within 10% RMS error compared to the existing model.
用于电路模拟器的soih栅极体束缚MOSFET精确全局模型
SOI h型体系MOSFET的漏极电流可以在栅极长度或宽度上进行调制,因为它具有额外的栅极区。这在模拟电路设计中引起了严重的问题。然而,即使在最新发布的BSIMSOI[1]中,也没有包含栅极形状效应的模型。首次在电路仿真中提出了一种精确的、全局的SOI h型体系MOSFET模型。结果表明,与现有模型相比,所提模型的仿真精度在10%的RMS误差范围内有较大提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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