Carrier concentration dependence of ballistic mobility and mean free path in a nano-dimensional InAlAs/InGaAs single gate HEMT

N. Sharma, J. Jogi, R. Gupta
{"title":"Carrier concentration dependence of ballistic mobility and mean free path in a nano-dimensional InAlAs/InGaAs single gate HEMT","authors":"N. Sharma, J. Jogi, R. Gupta","doi":"10.1109/UPCON.2016.7894675","DOIUrl":null,"url":null,"abstract":"This paper presents an analytical model for mobility in nano-dimensional InAlAs/InGaAs single gate HEMT. Effect of increase in carrier concentration on ballistic mobility in the nano-dimensional device is presented. The model accounts for quantization effects by solving a one-dimensional (1D) time-independent Schrodinger equation in a nano-scale channel at equilibrium. The eigen energies, thus obtained are employed to evaluate the carrier concentration of the 2DEG in the channel at equilibrium i.e no gate bias applied. The carrier mobility in the short channel is then utilized to calculate the ballistic mean free path. The ballistic mean free path of the carrier in the channel region is found to be substantially larger than the long channel mean free path.","PeriodicalId":151809,"journal":{"name":"2016 IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics Engineering (UPCON)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics Engineering (UPCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/UPCON.2016.7894675","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

This paper presents an analytical model for mobility in nano-dimensional InAlAs/InGaAs single gate HEMT. Effect of increase in carrier concentration on ballistic mobility in the nano-dimensional device is presented. The model accounts for quantization effects by solving a one-dimensional (1D) time-independent Schrodinger equation in a nano-scale channel at equilibrium. The eigen energies, thus obtained are employed to evaluate the carrier concentration of the 2DEG in the channel at equilibrium i.e no gate bias applied. The carrier mobility in the short channel is then utilized to calculate the ballistic mean free path. The ballistic mean free path of the carrier in the channel region is found to be substantially larger than the long channel mean free path.
纳米尺寸InAlAs/InGaAs单栅HEMT中载流子浓度对弹道迁移率和平均自由程的依赖
本文提出了纳米尺度InAlAs/InGaAs单栅HEMT的迁移率分析模型。研究了载流子浓度的增加对纳米器件中弹道迁移率的影响。该模型通过求解处于平衡状态的纳米尺度通道中的一维时间无关薛定谔方程来解释量子化效应。由此获得的本征能量被用来评估平衡状态下通道中2DEG的载流子浓度,即没有施加栅极偏置。然后利用短信道中的载流子迁移率计算弹道平均自由程。发现在通道区域的载体的弹道平均自由程大大大于长通道平均自由程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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