Fault and diagnosis on a successive approximation ADC

Abstract

In successive approximation A/D converters, the origin of failure is located through the bit error which is computed from the histogram, if it fulfil some conditions. In this paper, we present the real case of a failing A/D converter whose bit error is not computable. Consequently, the failure localization is performed using an alternative methodology including external electrical characterization and electron beam testing (EBT).