GaN power transistor switching performance in hard-switching and soft-switching modes

P. Sojka, M. Pipíška, M. Frivaldský
{"title":"GaN power transistor switching performance in hard-switching and soft-switching modes","authors":"P. Sojka, M. Pipíška, M. Frivaldský","doi":"10.1109/EPE.2019.8778060","DOIUrl":null,"url":null,"abstract":"The paper deals with the investigation of the switching performance of the GaN power transistors, while the focus is given on the comparisons of the performance within hard switching (HS) and soft switching, i.e. zero voltage switching commutation mode. For this purpose, specific testing device was utilized and adapted to switching requirements of selected transistor structure. Switching performance was identified in the way of power loss identification during the HS and ZVS commutation mode, whereby parametric evaluation in dependency on switching frequency and power load was done. The results show what is the amount of the power loss reduction when perspective transistor structure is used in combination with ZVS switching, even when very high frequency operation is considered.","PeriodicalId":117212,"journal":{"name":"2019 20th International Scientific Conference on Electric Power Engineering (EPE)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Scientific Conference on Electric Power Engineering (EPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPE.2019.8778060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

The paper deals with the investigation of the switching performance of the GaN power transistors, while the focus is given on the comparisons of the performance within hard switching (HS) and soft switching, i.e. zero voltage switching commutation mode. For this purpose, specific testing device was utilized and adapted to switching requirements of selected transistor structure. Switching performance was identified in the way of power loss identification during the HS and ZVS commutation mode, whereby parametric evaluation in dependency on switching frequency and power load was done. The results show what is the amount of the power loss reduction when perspective transistor structure is used in combination with ZVS switching, even when very high frequency operation is considered.
GaN功率晶体管在硬开关和软开关模式下的开关性能
本文对氮化镓功率晶体管的开关性能进行了研究,重点比较了硬开关(HS)和软开关(即零电压开关换流模式)的开关性能。为此,利用特定的测试装置,使其适应所选晶体管结构的开关要求。采用HS和ZVS换相模式下的功率损耗识别方法识别开关性能,并根据开关频率和功率负载进行参数化评估。结果显示了当透视晶体管结构与ZVS开关结合使用时,即使在考虑甚高频工作时,功率损耗降低的量是多少。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信