Multiphysics modelling for electronics design

J. Parry, C. Bailey, C. Aldham
{"title":"Multiphysics modelling for electronics design","authors":"J. Parry, C. Bailey, C. Aldham","doi":"10.1109/ITHERM.2000.866175","DOIUrl":null,"url":null,"abstract":"The future of many companies will depend to a large extent on their ability to initiate techniques that bring schedules, performance, tests, support, production, life-cycle-costs, reliability prediction and quality control into the earliest stages of the product creation process. Important questions for an engineer who is responsible for the quality of electronic parts such as printed circuit boards (PCBs) during design, production, assembly and after-sales support are: What is the impact of temperature? What is the impact of this temperature on the stress produced in the components? What is the electromagnetic compatibility (EMC) associated with such a design? At present, thermal, stress and EMC calculations are undertaken using different software tools that each require model build and meshing. This leads to a large investment in time, and hence cost, to undertake each of these simulations. This paper discusses the progression towards a fully integrated software environment, based on a common data model and user interface, having the capability to predict temperature, stress and EMC fields in a coupled manner. Such a modelling environment used early within the design stage of an electronic product will provide engineers with fast solutions to questions regarding thermal, stress and EMC issues. The paper concentrates on recent developments in creating such an integrated modeling environment with preliminary results from the analyses conducted. Further research into the thermal and stress related aspects of the paper is being conducted under a nationally funded project, while their application in reliability prediction will be addressed in a new European project called PROFIT.","PeriodicalId":201262,"journal":{"name":"ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069)","volume":"161 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITHERM.2000.866175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15

Abstract

The future of many companies will depend to a large extent on their ability to initiate techniques that bring schedules, performance, tests, support, production, life-cycle-costs, reliability prediction and quality control into the earliest stages of the product creation process. Important questions for an engineer who is responsible for the quality of electronic parts such as printed circuit boards (PCBs) during design, production, assembly and after-sales support are: What is the impact of temperature? What is the impact of this temperature on the stress produced in the components? What is the electromagnetic compatibility (EMC) associated with such a design? At present, thermal, stress and EMC calculations are undertaken using different software tools that each require model build and meshing. This leads to a large investment in time, and hence cost, to undertake each of these simulations. This paper discusses the progression towards a fully integrated software environment, based on a common data model and user interface, having the capability to predict temperature, stress and EMC fields in a coupled manner. Such a modelling environment used early within the design stage of an electronic product will provide engineers with fast solutions to questions regarding thermal, stress and EMC issues. The paper concentrates on recent developments in creating such an integrated modeling environment with preliminary results from the analyses conducted. Further research into the thermal and stress related aspects of the paper is being conducted under a nationally funded project, while their application in reliability prediction will be addressed in a new European project called PROFIT.
电子设计的多物理场建模
许多公司的未来将在很大程度上取决于他们是否有能力将进度、性能、测试、支持、生产、生命周期成本、可靠性预测和质量控制纳入产品创造过程的早期阶段。对于负责印制电路板(pcb)等电子部件质量的工程师来说,在设计、生产、组装和售后支持过程中,重要的问题是:温度的影响是什么?这个温度对元件产生的应力有什么影响?与这种设计相关的电磁兼容性(EMC)是什么?目前,热、应力和电磁兼容计算是使用不同的软件工具进行的,每个软件工具都需要建模和网格划分。这将导致在时间上的大量投资,从而导致进行这些模拟的成本。本文讨论了基于通用数据模型和用户界面的完全集成软件环境的进展,该环境具有以耦合方式预测温度、应力和EMC场的能力。这种在电子产品设计阶段早期使用的建模环境将为工程师提供有关热,应力和EMC问题的快速解决方案。本文集中讨论了创建这样一个集成建模环境的最新发展,以及所进行的分析的初步结果。该论文的热和应力相关方面的进一步研究正在一个国家资助的项目下进行,而它们在可靠性预测方面的应用将在一个名为PROFIT的新欧洲项目中进行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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