D. Boschetti, I. Marziali, M. Nicoletto, F. Bonfitto, B. Audone
{"title":"The use of the FIR filter to detect malfunctions induced by interference","authors":"D. Boschetti, I. Marziali, M. Nicoletto, F. Bonfitto, B. Audone","doi":"10.23919/AeroEMC.2019.8844188","DOIUrl":null,"url":null,"abstract":"The need of detecting susceptibilities at their onset is a fundamental issue if one wants to perform meaningful immunity tests on equipment and systems. Susceptibilities are often obscured by noise and in many cases it becomes difficult to discriminate situations of actual malfunction with the minimum risk of making detection errors. This paper tries to give an answer to this problem with a procedure commonly used in statistical signal processing theory. A novel method is proposed to detect malfunctions based upon the use of the tapped delay (TDL) line filter.","PeriodicalId":436679,"journal":{"name":"2019 ESA Workshop on Aerospace EMC (Aerospace EMC)","volume":"220 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 ESA Workshop on Aerospace EMC (Aerospace EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AeroEMC.2019.8844188","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The need of detecting susceptibilities at their onset is a fundamental issue if one wants to perform meaningful immunity tests on equipment and systems. Susceptibilities are often obscured by noise and in many cases it becomes difficult to discriminate situations of actual malfunction with the minimum risk of making detection errors. This paper tries to give an answer to this problem with a procedure commonly used in statistical signal processing theory. A novel method is proposed to detect malfunctions based upon the use of the tapped delay (TDL) line filter.