Reduced Complementary Dynamic and Differential Logic: A CMOS Logic Style for DPA-Resistant Secure IC Design

S. Rammohan, V. Sundaresan, R. Vemuri
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引用次数: 13

Abstract

In recent years, Differential Power Analysis (DPA) attack has become a major threat to the security of embedded cryptographic ICs (secure ICs) like smart cards. DPA attack is a powerful side-channel attack. During a DPA attack, the attacker uses power consumption measurements from the secure IC and statistical techniques to correlate the power consumption information leaked with the secret key stored in the secure IC, thus retrieving the secret key, and effectively breaking the secure IC. In this paper, we present a Reduced Complementary Dynamic and Differential Logic (RCDDL) style to design DPA-resistant, secure ICs. RCDDL style ensures that the power consumption of the secure IC remains invariant, and hence, uncorrelated to the input data (secret key). As opposed to existing DDL styles that complement every gate in the uncomplementary logic to generate the differential output, RCDDL style proposes reuse of gates, thus ensuring that a reduced number of gates in the uncomplementary logic are complemented to generate the differential output. Further, we present an analysis of how reduced complementation is achieved while maintaining the capacitance and switching requirements for power invariance. To evaluate the proposed logic style, we built a set of logic gates typically used to design secure ICs. Experiments on a set of circuits, designed using the set of RCDDL gates, show significant improvements in security strength, power consumption and area.
减少互补动态和差分逻辑:一种CMOS逻辑风格的抗dpa安全IC设计
近年来,差分功率分析(DPA)攻击已成为智能卡等嵌入式加密ic(安全ic)安全的主要威胁。DPA攻击是一种强大的侧信道攻击。在DPA攻击期间,攻击者使用安全IC的功耗测量和统计技术将泄漏的功耗信息与存储在安全IC中的密钥相关联,从而检索密钥,并有效地破坏安全IC。在本文中,我们提出了一种减少互补动态和差分逻辑(RCDDL)风格来设计抗DPA的安全IC。RCDDL风格确保安全IC的功耗保持不变,因此与输入数据(秘密密钥)不相关。与现有DDL风格补充非互补逻辑中的每个门以生成差分输出相反,RCDDL风格建议重用门,从而确保补充非互补逻辑中较少数量的门以生成差分输出。此外,我们还分析了如何在保持功率不变性的电容和开关要求的同时实现减少互补。为了评估所提出的逻辑风格,我们构建了一组通常用于设计安全ic的逻辑门。在采用RCDDL栅极设计的一组电路上的实验表明,该电路在安全强度、功耗和面积上都有显著提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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