{"title":"Design of a rad-hard library of digital cells for space applications","authors":"A. Stabile, V. Liberali, C. Calligaro","doi":"10.1109/ICECS.2008.4674813","DOIUrl":null,"url":null,"abstract":"This paper proposes a design methodology for a digital library of cells resistant to cosmic radiation. Most important effects due to radiation are avoided or mitigated using ad hoc design techniques. Fault injection techniques are used to validate the design. Simulations results demonstrate that the cells designed in a 180 nm CMOS technology are tolerant to 1.5 mA current peak due to interaction with a single high-energy particle.","PeriodicalId":404629,"journal":{"name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2008.4674813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31
Abstract
This paper proposes a design methodology for a digital library of cells resistant to cosmic radiation. Most important effects due to radiation are avoided or mitigated using ad hoc design techniques. Fault injection techniques are used to validate the design. Simulations results demonstrate that the cells designed in a 180 nm CMOS technology are tolerant to 1.5 mA current peak due to interaction with a single high-energy particle.