Statistical circuit analysis based on SABER

D. Li, Xiangning He, Jin Zhang, Yan Deng, R. Zhao
{"title":"Statistical circuit analysis based on SABER","authors":"D. Li, Xiangning He, Jin Zhang, Yan Deng, R. Zhao","doi":"10.1109/PCC.2002.997612","DOIUrl":null,"url":null,"abstract":"It is extremely useful for electrical engineers to predict design performance as component parameters deviate from the criterion value randomly. This work can be handled by a circuit simulation software, SABER, which covers powerful statistical analysis including Monte Carlo analysis and worst-case analysis. In the simulation environment of SABER, the circuit statistical analysis at randomly selected device parameters under certain tolerance bounds is illustrated in detail with a flyback convertor and an active band pass filter as examples. Moreover, the simulation wave and statistical summary are presented. Based on the statistical analysis results, the robustness of the circuit is appraised and the proportion of finished product in the batch production is forecasted. Furthermore, the acceptable tolerance bounds on the device parameters are obtained. The work in this paper is a practical guide to high robustness circuit design.","PeriodicalId":320424,"journal":{"name":"Proceedings of the Power Conversion Conference-Osaka 2002 (Cat. No.02TH8579)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Power Conversion Conference-Osaka 2002 (Cat. No.02TH8579)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PCC.2002.997612","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

It is extremely useful for electrical engineers to predict design performance as component parameters deviate from the criterion value randomly. This work can be handled by a circuit simulation software, SABER, which covers powerful statistical analysis including Monte Carlo analysis and worst-case analysis. In the simulation environment of SABER, the circuit statistical analysis at randomly selected device parameters under certain tolerance bounds is illustrated in detail with a flyback convertor and an active band pass filter as examples. Moreover, the simulation wave and statistical summary are presented. Based on the statistical analysis results, the robustness of the circuit is appraised and the proportion of finished product in the batch production is forecasted. Furthermore, the acceptable tolerance bounds on the device parameters are obtained. The work in this paper is a practical guide to high robustness circuit design.
基于SABER的统计电路分析
当元件参数随机偏离标准值时,对设计性能进行预测是非常有用的。这项工作可以通过电路仿真软件SABER来处理,该软件涵盖了强大的统计分析,包括蒙特卡罗分析和最坏情况分析。在SABER仿真环境下,以反激变换器和有源带通滤波器为例,详细阐述了随机选择器件参数在一定容限下的电路统计分析。并给出了仿真波形和统计总结。根据统计分析结果,对电路的鲁棒性进行了评价,并对成品在批量生产中的比例进行了预测。此外,还得到了器件参数的可接受公差范围。本文的工作对高鲁棒性电路设计具有实际指导意义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信