Structured Design and Evaluation of a Resistor-Based PUF Robust Against PVT-Variations

Abstract

This paper proposes a new fully CMOS-compatible PUF primitive robust against process variations, supply voltage variations and temperature drift (PVT) based on resistive structures that implements advanced compensation mechanisms already on circuit level. Based on analog simulation data, the PUF is evaluated regarding its unpredictability and its reliability. The results indicate a high quality. Further, a structured approach for designing a suitable error correction is presented to illustrate the whole PUF system.