S. Itoh, T. Usui, K. Akahane, N. Ishikawa, T. Yokoyama, Y. Maeda
{"title":"High speed polysilicon deposition process for dielectric isolation technology","authors":"S. Itoh, T. Usui, K. Akahane, N. Ishikawa, T. Yokoyama, Y. Maeda","doi":"10.1109/ISPSD.1990.991080","DOIUrl":null,"url":null,"abstract":"ABS\" This paper describes a newly developed high speed polysilicon deposition process in which molten silicon is sprayed on a substrate and solidified. By utilizing this process, a 500pn thick plysilicon layer which acts as a mechanical support of dielectrically isolated substrate was deposited in only a few minutes. Filling of the polysilicon in V-grooves, curvature of substrates, and dislocations induced in substrates are discussed. The characteristics of a high voltage LSI fabricated using this process is also described.","PeriodicalId":162198,"journal":{"name":"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1990.991080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
ABS" This paper describes a newly developed high speed polysilicon deposition process in which molten silicon is sprayed on a substrate and solidified. By utilizing this process, a 500pn thick plysilicon layer which acts as a mechanical support of dielectrically isolated substrate was deposited in only a few minutes. Filling of the polysilicon in V-grooves, curvature of substrates, and dislocations induced in substrates are discussed. The characteristics of a high voltage LSI fabricated using this process is also described.