Modeling switching losses in MOSFETs half-bridges

G. Di Capua, N. Femia
{"title":"Modeling switching losses in MOSFETs half-bridges","authors":"G. Di Capua, N. Femia","doi":"10.1109/SMACD.2012.6339425","DOIUrl":null,"url":null,"abstract":"This paper discusses the modeling of switching losses in MOSFETs half-bridges. The model proposed in the paper provides a trade-off between accuracy and computing simplicity for quick feasibility investigations and comparative evaluations among different MOSFETs combinations to be selected for the design of high-efficiency switching power supplies. The proposed model also enables a detailed analysis of capacitive currents circulating through the MOSFETs during commutations, thus allowing a more accurate loss understanding and calculation.","PeriodicalId":181205,"journal":{"name":"2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD.2012.6339425","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This paper discusses the modeling of switching losses in MOSFETs half-bridges. The model proposed in the paper provides a trade-off between accuracy and computing simplicity for quick feasibility investigations and comparative evaluations among different MOSFETs combinations to be selected for the design of high-efficiency switching power supplies. The proposed model also enables a detailed analysis of capacitive currents circulating through the MOSFETs during commutations, thus allowing a more accurate loss understanding and calculation.
mosfet半桥开关损耗建模
本文讨论了mosfet半桥中开关损耗的建模。本文提出的模型在准确性和计算简单性之间提供了权衡,以便快速进行可行性调查和比较评估,以选择不同的mosfet组合来设计高效开关电源。所提出的模型还可以详细分析在换流过程中流过mosfet的电容电流,从而可以更准确地理解和计算损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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