A time delay integration CMOS image sensor with online deblurring algorithm

VLSI Design, Automation and Test(VLSI-DAT) Pub Date : 2015-04-27 DOI:10.1109/VLSI-DAT.2015.7114510

Hang Yu, Xinyuan Qian, M. Guo, Shoushun Chen, K. Low

引用次数: 2

Abstract

This paper presents an online deblurring (ODB) algorithm for time delay integration (TDI) CMOS image sensor (CIS) used in small remote imaging systems, where image quality is degraded due to vibration caused by different factors. The ODB algorithm can detect and compensate the image shift so as to produce sharp TDI images. A 256×8-pixel prototype chip was fabricated using a 0.18μm CIS technology, which contains 8 TDI stages, column-parallel TDI accumulation and online deblurring circuits. The 4-transistor active pixel sensor (4T-APS) is applied, with the pixel size of 6.5μm×6.5μm and the fill factor of 28%.

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一种带有在线去模糊算法的延时集成CMOS图像传感器

针对小型远程成像系统中由于各种因素引起的振动会导致图像质量下降的问题，提出了一种针对延迟集成(TDI) CMOS图像传感器(CIS)的在线去模糊(ODB)算法。ODB算法可以检测和补偿图像偏移，从而产生清晰的TDI图像。采用0.18μm CIS工艺制作了256×8-pixel原型芯片，该芯片包含8个TDI级、列-并联TDI积累和在线去模糊电路。采用4晶体管有源像素传感器(4T-APS)，像素尺寸为6.5μm×6.5μm，填充系数为28%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

VLSI Design, Automation and Test(VLSI-DAT)

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