Importance of complete characterization setup on on-wafer TRL calibration in sub-THz range

Abstract

In this paper, we present the effect of different sub-mm and mm-wave probe geometry and topology on the measurement results of dedicated test-structures calibrated with on-wafer TRL. These results are compared against 3D EM simulation of the intrinsic test-structures. To analyze difference between the measured and intrinsic EM simulation results, on-wafer TRL calibration performed on EM simulation results of a dedicated test-structure is also presented.