A 98 mm/sup 2/ 3.3 V 64 Mb flash memory with FN-NOR type 4-level cell

M. Ohkawa, H. Sugawara, N. Sudo, M. Tsukiji, K. Nakagawa, M. Kawata, K. Oyama, T. Takeshima, S. Ohya
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引用次数: 11

Abstract

A 64 Mb flash memory has a multi-level cell and 64-memory-cell parallel programming. 98 mm/sup 2/ die uses 0.4 /spl mu/m CMOS and 4-levels (2b) per cell. 3.3 V operation and 6.3 /spl mu/s/B programming are achieved by using a Fowler-Nordheim (FN) NOR memory cell. Drain-voltage controlled multilevel programming (DCMP) is the key technology for simultaneous multi-level programming in the chip. To implement DCMP, a parallel multi-level verify (PMV) circuit and the compact multi-level sense amplifier (CMS), which enable a 64-memory-cells parallel programming operation (program/program verify), are used.
一个98毫米/sup 2/ 3.3 V 64 Mb闪存,带有FN-NOR型4级电池
64 Mb闪存具有多级单元和64内存单元并行编程。98 mm/sup 2/ die使用0.4 /spl mu/m CMOS和4级(2b)每个单元。采用Fowler-Nordheim (FN) NOR存储单元实现3.3 V运行和6.3 /spl mu/s/B编程。漏极电压控制多电平编程(DCMP)是实现芯片同步多电平编程的关键技术。为了实现DCMP,使用了并行多电平验证(PMV)电路和紧凑的多电平感测放大器(CMS),这使得64个存储单元并行编程操作(程序/程序验证)成为可能。
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