Computationally efficient parametric yield estimation of linear electronic circuits

Abstract

This paper recommends a new efficient method for statistical analysis of linear electronic circuits, when elements tolerances are given. The method copes with small and large tolerance values equally. Only one LU factorization of system matrix as whole is necessary, for each frequency/time point. Tolerance simulator was developed on the bases of this method, including graphical postprocessor suitable for observing statistical characteristics, and yield of a circuit.