The failure mechanism of electromagnetic relay in accelerated storage degradation testing

Zhao-Bin Wang, Zhoulin Huang, Jiawei Wang, Shang Shang, G. Zhai
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引用次数: 7

Abstract

The most past research on storage reliability of electromagnetic relay (EMR) only focuses on the measurement of contact resistance. The relay time parameters which reflect main performance function were not monitored. So, in this study the relay time parameters and relay contact resistance were detected simultaneously. The method of prognostics and health management (PHM) was used. According to the analysis on test results of contact resistance, relay time parameters, the degradation phenomena of EMR in long-term storage are investigated, and the storage failure mechanism is analyzed. The microscopic morphology and changes in chemical elements for relay contact surface was analyzed, which provide references for the relay storage failure mechanisms.
电磁继电器在加速存储退化试验中的失效机理
以往对电磁继电器存储可靠性的研究大多集中在接触电阻的测量上。未监测反映主要性能功能的继电器时间参数。因此,本研究同时检测继电器的时间参数和继电器的接触电阻。采用预后与健康管理(PHM)方法。通过对接触电阻、继电器时间参数测试结果的分析,研究了EMR在长期贮存过程中的退化现象,并分析了EMR贮存失效机理。分析了继电器接触表面的微观形貌和化学元素的变化,为继电器储存失效机理提供了参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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