Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants

Chaofang Ma, Jianan Mu, Jing Ye, Shuai Chen, Yuan Cao, Huawei Li, Xiaowei Li
{"title":"Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants","authors":"Chaofang Ma, Jianan Mu, Jing Ye, Shuai Chen, Yuan Cao, Huawei Li, Xiaowei Li","doi":"10.1109/ETS56758.2023.10174198","DOIUrl":null,"url":null,"abstract":"Physical Unclonable Function (PUF) is a hardware security primitive with broad application prospects. Variants of the arbiter PUF have been proposed to resist modeling attacks. However, their low reliability issue limits their applications. To solve the low reliability issue, this paper proposes an Online Reliability Evaluation (ORE) design for the arbiter PUF and its variants. Moreover, a corresponding machine learning method to select reliable Challenge Response Pairs (CRPs) for applications is proposed. Based on the ORE design, a small number of CRPs and their reliability levels are collected during the enrollment phase. Then they are trained to build reliability models for predicting the responses and reliability levels of other challenges. Since the ORE design does not change the security structures of the arbiter PUF and its variants, the resistance to modeling attacks of PUF designs equipped with it is maintained. Compared to the previous work that tests 100,000 times per CRP, our design is time-saving in the enrollment phase since each CRP is only tested three times for training reliability models. The proposed design is implemented under the 40nm process. Experimental results on real chips show that all the CRPs selected by our reliability models are indeed reliable for applications, verifying the effectiveness of our method.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS56758.2023.10174198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Physical Unclonable Function (PUF) is a hardware security primitive with broad application prospects. Variants of the arbiter PUF have been proposed to resist modeling attacks. However, their low reliability issue limits their applications. To solve the low reliability issue, this paper proposes an Online Reliability Evaluation (ORE) design for the arbiter PUF and its variants. Moreover, a corresponding machine learning method to select reliable Challenge Response Pairs (CRPs) for applications is proposed. Based on the ORE design, a small number of CRPs and their reliability levels are collected during the enrollment phase. Then they are trained to build reliability models for predicting the responses and reliability levels of other challenges. Since the ORE design does not change the security structures of the arbiter PUF and its variants, the resistance to modeling attacks of PUF designs equipped with it is maintained. Compared to the previous work that tests 100,000 times per CRP, our design is time-saving in the enrollment phase since each CRP is only tested three times for training reliability models. The proposed design is implemented under the 40nm process. Experimental results on real chips show that all the CRPs selected by our reliability models are indeed reliable for applications, verifying the effectiveness of our method.
联机可靠性评估设计:仲裁者PUF及其变体的可靠crp选择
物理不可克隆函数(PUF)是一种具有广泛应用前景的硬件安全原语。已经提出了仲裁器PUF的变体来抵抗建模攻击。然而,它们的低可靠性问题限制了它们的应用。为了解决低可靠性问题,本文提出了一种针对仲裁PUF及其变体的在线可靠性评估(ORE)设计。此外,提出了一种相应的机器学习方法来选择可靠的挑战响应对(CRPs)。基于ORE设计,在注册阶段收集少量的crp及其可靠性水平。然后训练他们建立可靠性模型来预测其他挑战的反应和可靠性水平。由于ORE设计不改变仲裁PUF及其变体的安全结构,因此配备它的PUF设计对建模攻击的抵抗力得以保持。与之前每个CRP测试100,000次的工作相比,我们的设计在登记阶段节省了时间,因为每个CRP只测试三次用于训练可靠性模型。该设计是在40nm制程下实现的。在实际芯片上的实验结果表明,我们的可靠性模型所选择的所有crp都是可靠的,验证了我们的方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信