Research on Accelerated Life Test Method of Electronic Products Base on Multidimensional Stress Coupling

Abstract

It provide a new method for accelerated life test of electronic products in multi-dimensional stress-coupling environment, considering the multi-dimensional accelerated stress type, and the failure mode and failure mechanism. The multi-dimensional stress accelerated life test model is built by multi-dimensional coupled stress processing method which choose traditional single dimension accelerated life test model. The new model can give support and guidance for the accelerated life test program design. It can solve some problems such as the condition of accelerated life test which cannot consider the relationship of multi-dimensional stress coupling, then it can greatly improve the authenticity and accuracy of the accelerated test of satellite electronic products.