Digital circuits verification with consideration of destabilizing factors

R. Goldman, Vazgen Melikyan, E. Babayan
{"title":"Digital circuits verification with consideration of destabilizing factors","authors":"R. Goldman, Vazgen Melikyan, E. Babayan","doi":"10.1109/IDT.2011.6123109","DOIUrl":null,"url":null,"abstract":"New principles of verification system construction, with consideration of the impact of various internal and external destabilizing factors are presented. It is shown that the proposed principles allow keeping the main advantages of the traditional digital circuit logic simulation, while eliminating key limitations. Verification system is based on new cell and digital circuit models which consider destabilizing factor impact on circuit operation.","PeriodicalId":167786,"journal":{"name":"2011 IEEE 6th International Design and Test Workshop (IDT)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 6th International Design and Test Workshop (IDT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDT.2011.6123109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

New principles of verification system construction, with consideration of the impact of various internal and external destabilizing factors are presented. It is shown that the proposed principles allow keeping the main advantages of the traditional digital circuit logic simulation, while eliminating key limitations. Verification system is based on new cell and digital circuit models which consider destabilizing factor impact on circuit operation.
考虑不稳定因素的数字电路验证
考虑到各种内外不稳定因素的影响,提出了新的核查制度建设原则。结果表明,所提出的原理既保留了传统数字电路逻辑仿真的主要优点,又消除了关键的局限性。验证系统基于新的单元和数字电路模型,考虑了不稳定因素对电路运行的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信