Space-charge and conduction-current measurements for the evaluation of aging of insulating materials for DC applications

1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319) Pub Date : 1999-10-17 DOI:10.1109/CEIDP.1999.804587

G. Montanari, D. Fabiani, L. Bencivenni, B. Garros, C. Audry

{"title":"Space-charge and conduction-current measurements for the evaluation of aging of insulating materials for DC applications","authors":"G. Montanari, D. Fabiani, L. Bencivenni, B. Garros, C. Audry","doi":"10.1109/CEIDP.1999.804587","DOIUrl":null,"url":null,"abstract":"This paper focuses on the measurement of charging current and space charges as the tool to obtain early indications of aging occurring in XLPE specimens under DC electrical stress. A sample of flat specimens was subjected to DC electrical field of 45 kV/mm under vacuum, at room temperature. For 1700 hours. At different aging times, some specimens were removed from the aging cell and measurements of the above-mentioned properties performed, with the main aim to investigate for electrical threshold evolution with time. The threshold was inferred by space charge observations and conduction current measurements, performed at different values of electrical field and room temperature. Moreover, microstructural investigation was carried out by small-angle X-ray scattering, SAXS, technique. It is shown that the electrical threshold is a sensitive indicator of aging, decreasing as stress time increases and displaying variations after times several order of magnitude lower than the expected insulation life. Likewise, SAXS measurements provide indication of sub-microcavity length variation with aging time.","PeriodicalId":267509,"journal":{"name":"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1999.804587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 16

Abstract

This paper focuses on the measurement of charging current and space charges as the tool to obtain early indications of aging occurring in XLPE specimens under DC electrical stress. A sample of flat specimens was subjected to DC electrical field of 45 kV/mm under vacuum, at room temperature. For 1700 hours. At different aging times, some specimens were removed from the aging cell and measurements of the above-mentioned properties performed, with the main aim to investigate for electrical threshold evolution with time. The threshold was inferred by space charge observations and conduction current measurements, performed at different values of electrical field and room temperature. Moreover, microstructural investigation was carried out by small-angle X-ray scattering, SAXS, technique. It is shown that the electrical threshold is a sensitive indicator of aging, decreasing as stress time increases and displaying variations after times several order of magnitude lower than the expected insulation life. Likewise, SAXS measurements provide indication of sub-microcavity length variation with aging time.

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评价直流绝缘材料老化的空间电荷和传导电流测量

本文重点研究了充电电流和空间电荷的测量方法，以获得交联聚乙烯试样在直流电应力作用下发生老化的早期迹象。在室温条件下，将平面试样置于45 kV/mm的直流电场中。1700小时。在不同的时效时间下，从老化细胞中取出一些样品，对上述性能进行测量，主要目的是研究电阈值随时间的变化。该阈值是通过在不同电场值和室温下的空间电荷观测和传导电流测量来推断的。利用小角x射线散射(SAXS)技术对材料进行了显微组织研究。结果表明，电阈值是老化的敏感指标，随着应力时间的增加而降低，并在低于预期绝缘寿命几个数量级之后呈现变化。同样，SAXS测量提供了亚微腔长度随时效时间变化的指示。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319)

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