Simulation of wafer scale diagnosis

Abstract

Summary form only given. DWI (Diagnosis of Wafer Scale Integrated Circuits), is a DOS C/sup ++/ program whose purpose is to assess the practicality of system-level diagnosis on a wafer scale. On the manufacturing line, diagnosis offers a replacement for probe test. For in-the-field operation, diagnosis holds promise for increasing the accuracy whereby faulty elements are identified, at reduced cost. With all of these applications, diagnosis eliminates or greatly reduces the need of external test equipment. The increasing prevalence of monolithic and multichip wafer scale modules may accelerate the search for alternatives to probe and scan. DWI can help the designer answer architectural questions such as: 1) What is the effect of the element failure rate and distribution of failures? 2) What is the best diagnosis algorithm?.