{"title":"A Quantity Evaluation and Reconfiguration Mechanism for Signal- and Power-Interconnections in 3D-Stacking System","authors":"Ching-Hwa Cheng","doi":"10.1109/ASP-DAC47756.2020.9045169","DOIUrl":null,"url":null,"abstract":"Due to the high integration required for system application, the three-dimensional chip may resolve this requirement. The three-dimensional vertically stacking (3D-stacking) systems have been proposed to satisfy these requirements. However, the 3D-stacking system contains several design risks from its long layer interconnections. For a 3D-stacking system, it is difficult to identify where the numerous power and signal-interconnection are open-, shorted-fault, or resistive-short has accrued. Therefore, solving these interconnection problems is necessary. A feasible interconnection quality-evaluation, fault-diagnosis, and connection-reconfigurable mechanism are proposed. The proposed interconnection-measurement-recovery (IMR) mechanism will make it easy to find interconnection faults and make recovery in 3D-Stacking systems. The proposed IMR can detect interconnection open, short, bridge and resistive defects with the path-reroute mechanism. Future more, the signal transmission quality can be measured. This measurement provides to monitor signal propagation in pico-second accuracy. IMR has less extra area and power consumption overhead. The feasibilities of the proposed mechanism have been justified by 2D-chip and 3D-stacking MorPack both systems.","PeriodicalId":125112,"journal":{"name":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASP-DAC47756.2020.9045169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Due to the high integration required for system application, the three-dimensional chip may resolve this requirement. The three-dimensional vertically stacking (3D-stacking) systems have been proposed to satisfy these requirements. However, the 3D-stacking system contains several design risks from its long layer interconnections. For a 3D-stacking system, it is difficult to identify where the numerous power and signal-interconnection are open-, shorted-fault, or resistive-short has accrued. Therefore, solving these interconnection problems is necessary. A feasible interconnection quality-evaluation, fault-diagnosis, and connection-reconfigurable mechanism are proposed. The proposed interconnection-measurement-recovery (IMR) mechanism will make it easy to find interconnection faults and make recovery in 3D-Stacking systems. The proposed IMR can detect interconnection open, short, bridge and resistive defects with the path-reroute mechanism. Future more, the signal transmission quality can be measured. This measurement provides to monitor signal propagation in pico-second accuracy. IMR has less extra area and power consumption overhead. The feasibilities of the proposed mechanism have been justified by 2D-chip and 3D-stacking MorPack both systems.